Oakland’s ABS.025-VF Precision Bench Micrometer is a robust choice for high resolution
film thickness gauging and profiling to 0.005 mil resolution, with Parallelism Adjustable
Anvil Technology and adjustable contact foot pressure.
Designed for high-performance thickness inspection of film and foil, the MP Series
provide very high resolution and accuracy. Resolution to five millionths of an inch
(0.0002 mm) with accuracy to 12.5 microinches. Air-actuated LVDT contact sensor on
Model MP-1VF allows variable gaging force settings down to 10 grams. Proprietary
"floating anvil" on Models MP-1 System II and MP-1VF System III eliminates parallelism
error, improving accuracy with soft or compressible material measurement. Push-button
zero on all models for ease-of-use.
Connect a computer and our DAQ-MIC Software for collection of point-to-point thickness
profiles plus summary statistics, data file save & retrieve, report printing, and
more.
